Title :
SVM-Based Microcalcification Detection in Digital Mammograms
Author :
Ye, Jin ; Zheng, Sheng ; Yang, Changcai
Author_Institution :
Inst. of Intell. Vision & Image Inf., China Three Gorges Univ., Yichang
Abstract :
Mammography is one of the most efficient imaging techniques for the early detection and diagnosis of breast cancer in woman. The appearance of microcalcifications (MCs) in X-ray mammograms can be regarded as important early diagnostic feature of breast cancer. However, the detection of MCs in X-ray mammograms only depend on radiologists by visual inspection is a difficult task. In this paper, a novel algorithm for the automated detection of MCs in digital mammograms is described. The aim of approach is to locate suspicious MCs by analyzing the distribution of brightness over the digital mammograms. The algorithm for the detection of MCs is performed in two steps. First, the digital X-ray mammogram intensity surface is well-fitted by the least squares support vector machines (LS-SVM), and then the maximum extremum points are detected on the fitted intensity surface by convolving the image with the second order directional derivative operators deduced from the mapped LS-SVM with mixture of kernels. The proposed approach is developed and evaluated by using MIAS database. The experimental results demonstrate the possible MCs are detected accurately and efficiently.
Keywords :
X-ray imaging; cancer; least squares approximations; mammography; medical image processing; support vector machines; X-ray mammograms; breast cancer; digital X-ray mammogram; least squares support vector machines; mammography; microcalcification detection; Breast cancer; Brightness; Cancer detection; Inspection; Least squares methods; Mammography; Optical imaging; X-ray detection; X-ray detectors; X-ray imaging; LS-SVM; computer-aid diagnosis; mammography; microcacification;
Conference_Titel :
Computer Science and Software Engineering, 2008 International Conference on
Conference_Location :
Wuhan, Hubei
Print_ISBN :
978-0-7695-3336-0
DOI :
10.1109/CSSE.2008.1474