Title :
Determination of refractive indices of optical wafers by interferometric method
Author :
Choi, Hee Joo ; Lim, Hwan Hong ; Bae, In-ho ; Moon, Han Seb ; Cha, Myoungsik ; Eom, Tae Bong ; Ju, Jung Jin
Author_Institution :
Dept. of Phys., Pusan Nat. Univ., Busan, South Korea
Abstract :
For accurate index measurement, we investigated Fabry-Perot type interference from optical wafers. Since this method is insensitive to environmental perturbation and simple to implement, it can be used to establish dispersion formula for newly developed optical materials.
Keywords :
Fabry-Perot interferometers; light interferometry; optical materials; refractive index measurement; dispersion formula; environmental perturbation; interferometric method; optical materials; optical wafers; refractive index measurement; Fabry-Perot; Fiber nonlinear optics; Frequency conversion; Nonlinear optics; Optical interferometry; Optical materials; Optical refraction; Optical sensors; Optical variables control; Refractive index; Fabry-Perot; index of refraction; interference; optical crystal; optical material;
Conference_Titel :
Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics, 2009. CLEO/PACIFIC RIM '09. Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3829-7
Electronic_ISBN :
978-1-4244-3830-3
DOI :
10.1109/CLEOPR.2009.5292472
