Title : 
Physical Explanation to the Electromagnetic Scattering of a Thin Metallic Plate at Very Low Frequencies
         
        
        
            Author_Institution : 
Microwave Remote Sensing Lab. Center for Space Sci. & Appl. Res., Chinese Acad. of Sci., Beijing
         
        
        
        
        
        
            Abstract : 
The scattering of a thin metallic plate at very low frequencies is investigated by using the method of moments (MoM) with loop/tree basis function. Calculations show that at low frequencies the scattering of a very thin plate and the scattering of a zero-depth plate are very different not only for the current distribution but also for the RCS. However, the differences are very small at high frequencies. A physical explanation is given to the phenomenon: both the electromagnetic dipole and magnetic dipole are excited simultaneously when illuminated by a very low frequency electromagnetic wave for a general three-dimensional object but the magnetic dipole could not be excited for a zero-depth plate. The appearance of the magnetic dipole makes the scattered electric far field unstable due to the finite digital precision of the computer. A simple method is shown how to make the far field calculation stable.
         
        
            Keywords : 
electromagnetic wave scattering; method of moments; electric far field; electromagnetic dipole; electromagnetic scattering; electromagnetic wave; finite digital precision; loop basis function; magnetic dipole; method of moments; thin metallic plate; tree basis function; zero-depth plate; Couplings; Current distribution; Electric breakdown; Electromagnetic scattering; Frequency; Impedance; Magnetic fields; Maxwell equations; Microwave theory and techniques; Moment methods; EFIE; Loop/Tree basis; RWG basis; low-frequency scattering; method of moments;
         
        
        
        
            Conference_Titel : 
Microwave Conference, 2007. APMC 2007. Asia-Pacific
         
        
            Conference_Location : 
Bangkok
         
        
            Print_ISBN : 
978-1-4244-0748-4
         
        
            Electronic_ISBN : 
978-1-4244-0749-1
         
        
        
            DOI : 
10.1109/APMC.2007.4554885