Title :
BSIM — Industry standard compact MOSFET models
Author :
Chauhan, Yogesh Singh ; Venugopalan, Sriram ; Karim, Mohammed A. ; Khandelwal, Sourabh ; Paydavosi, Navid ; Thakur, Pankaj ; Niknejad, Ali M. ; Hu, Chenming C.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. (IIT), Kanpur, India
Abstract :
BSIM compact models have served industry for more than a decade starting with BSIM3 and later BSIM4 and BSIMSOI. Here we will briefly discuss the ongoing work on current and future device models in BSIM group. BSIM6 is the next generation bulk RF MOSFET Model which uses charge based core with physical models adapted from BSIM4. Model fulfills all symmetry tests and shows correct slopes for harmonics. The BSIM-CMG and BSIM-IMG are the surface potential based models for multi-gate MOSFETs. The BSIM-CMG model has been developed to model common symmetric double, triple, quadruple and surround gate MOSFET. The BSIM-IMG model has been developed to model independent double-gate MOSFET capturing threshold voltage variation with back gate bias. Models include all read device effects like SCE, DIBL, mobility degradation, poly depletion, QME etc.
Keywords :
MOSFET; semiconductor device models; surface potential; BSIM compact model; BSIM-CMG model; BSIM-IMG; BSIM3; BSIM4; BSIM6; BSIMSOI; back gate bias; charge based core; device model; double-gate MOSFET; harmonics; industry standard; multigate MOSFET; next generation bulk RF MOSFET model; surface potential; surround gate MOSFET; symmetric double MOSFET; symmetric quadruple MOSFET; symmetric triple MOSFET; threshold voltage variation; Adaptation models; Computational modeling; FinFETs; Integrated circuit modeling; Logic gates; MOSFET circuits; Threshold voltage;
Conference_Titel :
ESSCIRC (ESSCIRC), 2012 Proceedings of the
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4673-2212-6
Electronic_ISBN :
1930-8833
DOI :
10.1109/ESSCIRC.2012.6341249