• DocumentCode
    1978197
  • Title

    BSIM — Industry standard compact MOSFET models

  • Author

    Chauhan, Yogesh Singh ; Venugopalan, Sriram ; Karim, Mohammed A. ; Khandelwal, Sourabh ; Paydavosi, Navid ; Thakur, Pankaj ; Niknejad, Ali M. ; Hu, Chenming C.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. (IIT), Kanpur, India
  • fYear
    2012
  • fDate
    17-21 Sept. 2012
  • Firstpage
    30
  • Lastpage
    33
  • Abstract
    BSIM compact models have served industry for more than a decade starting with BSIM3 and later BSIM4 and BSIMSOI. Here we will briefly discuss the ongoing work on current and future device models in BSIM group. BSIM6 is the next generation bulk RF MOSFET Model which uses charge based core with physical models adapted from BSIM4. Model fulfills all symmetry tests and shows correct slopes for harmonics. The BSIM-CMG and BSIM-IMG are the surface potential based models for multi-gate MOSFETs. The BSIM-CMG model has been developed to model common symmetric double, triple, quadruple and surround gate MOSFET. The BSIM-IMG model has been developed to model independent double-gate MOSFET capturing threshold voltage variation with back gate bias. Models include all read device effects like SCE, DIBL, mobility degradation, poly depletion, QME etc.
  • Keywords
    MOSFET; semiconductor device models; surface potential; BSIM compact model; BSIM-CMG model; BSIM-IMG; BSIM3; BSIM4; BSIM6; BSIMSOI; back gate bias; charge based core; device model; double-gate MOSFET; harmonics; industry standard; multigate MOSFET; next generation bulk RF MOSFET model; surface potential; surround gate MOSFET; symmetric double MOSFET; symmetric quadruple MOSFET; symmetric triple MOSFET; threshold voltage variation; Adaptation models; Computational modeling; FinFETs; Integrated circuit modeling; Logic gates; MOSFET circuits; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC (ESSCIRC), 2012 Proceedings of the
  • Conference_Location
    Bordeaux
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4673-2212-6
  • Electronic_ISBN
    1930-8833
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2012.6341249
  • Filename
    6341249