Title :
Orientational and strain dependence of the mobility in silicon nanowires
Author :
Niquet, Y.M. ; Delerue, C. ; Rideau, D.
Author_Institution :
L- Sim, UJF-Grenoble 1, Grenoble, France
Abstract :
We discuss the phonon-limited mobility of electrons and holes in silicon nanowires as a function of diameter and orientation. We show that 〈110〉 and 〈001〉 nanowires are the best n-type channels, while 〈110〉 and 〈111〉 nanowires are the best p-type channels. We also investigate the mobility in stretched silicon nanowires. We show that the electron and hole mobility can be enhanced or reduced by a factor >; 2 for moderate axial strains <; 1%.
Keywords :
nanowires; electrons; hole mobility; moderate axial strain; phonon-limited mobility; strain dependence; stretched silicon nanowires; Electron mobility; Nanowires; Phonons; Scattering; Silicon; Strain;
Conference_Titel :
Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on
Conference_Location :
Grenoble
Print_ISBN :
978-1-4673-0191-6
Electronic_ISBN :
978-1-4673-0190-9
DOI :
10.1109/ULIS.2012.6193354