DocumentCode :
1978330
Title :
Modular fault recovery in timed discrete-event systems: application to a manufacturing cell
Author :
Moosaei, Mohammad ; Zad, Shahin Hashtrudi
Author_Institution :
FSC Consulting, Edmonton, Alta.
fYear :
2005
fDate :
28-31 Aug. 2005
Firstpage :
928
Lastpage :
933
Abstract :
This paper extends the previous results of the authors on fault recovery to timed discrete-event systems (TDES), and discusses the application of the proposed methodology to a manufacturing cell. It is assumed that the plant can be modelled as a TDES, the faults are permanent, and that a diagnosis system is available that detects and isolates faults with a bounded delay (expressed in clock ticks). Thus, the combination of the plant and the diagnosis system, as the system to be controlled, has three modes: normal, transient and recovery. Initially, the plant is in the normal mode. Once a fault occurs, the system enters the transient mode. After the fault is detected and isolated by the diagnosis system, the system enters the recovery mode. This framework does not depend on the diagnosis technique used, as long as lower and upper bounds for diagnosis delay are available. A modular switching supervisory scheme is proposed to satisfy the system specifications. The design consists of a normal-transient supervisor, and multiple recovery supervisors each for recovery from a particular failure mode. The issue of the nonblocking property of the system under supervision, and also supervisor admissibility (controllability), in particular coerciveness, are studied. The proposed approach is applied to a manufacturing cell consisting of two machines and two conveyors. A modular switching supervisor is designed to ensure the specifications in the normal mode are met. In cases of failure, the supervisor sends appropriate recovery commands so that the cell can complete its production cycle
Keywords :
delay systems; discrete time systems; fault diagnosis; formal specification; manufacturing processes; system recovery; TDES; clock tick; diagnosis delay; diagnosis system; fault detection; manufacturing cell; modular fault recovery; modular switching supervisory; multiple recovery supervisor; nonblocking property; normal-transient supervisor; production cycle; supervisor admissibility; system specification; timed discrete-event system; Clocks; Control systems; Controllability; Delay; Discrete event systems; Fault detection; Fault diagnosis; Production; Pulp manufacturing; Upper bound;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Applications, 2005. CCA 2005. Proceedings of 2005 IEEE Conference on
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-9354-6
Type :
conf
DOI :
10.1109/CCA.2005.1507248
Filename :
1507248
Link To Document :
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