Title :
Applications Of Importance Sampling To Simulations Of Emission Tomography
Author :
Haynor, David R. ; Pollard, Kenneth R. ; Harrison, Robert L. ; Lewellen, Thomas K.
Author_Institution :
University of Washington
Keywords :
Attenuation; Computational modeling; Detectors; Electromagnetic scattering; Frequency; Monte Carlo methods; Optical collimators; Optical computing; Particle scattering; Single photon emission computed tomography;
Conference_Titel :
Nuclear Science Symposium, 1990. Conference record : Including Sessions on Nuclear Power Systems and Medical Imaging Conference, 1990 IEEE
Print_ISBN :
0-87942-683-7
DOI :
10.1109/NSSMIC.1990.693606