DocumentCode :
1978373
Title :
Applications Of Importance Sampling To Simulations Of Emission Tomography
Author :
Haynor, David R. ; Pollard, Kenneth R. ; Harrison, Robert L. ; Lewellen, Thomas K.
Author_Institution :
University of Washington
fYear :
1990
fDate :
22-27 Oct 1990
Firstpage :
1579
Lastpage :
1583
Keywords :
Attenuation; Computational modeling; Detectors; Electromagnetic scattering; Frequency; Monte Carlo methods; Optical collimators; Optical computing; Particle scattering; Single photon emission computed tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1990. Conference record : Including Sessions on Nuclear Power Systems and Medical Imaging Conference, 1990 IEEE
Print_ISBN :
0-87942-683-7
Type :
conf
DOI :
10.1109/NSSMIC.1990.693606
Filename :
693606
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1978373
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