• DocumentCode
    1978402
  • Title

    Energy capability of LDMOS as a function of ambient temperature

  • Author

    Basavalingappa, Adarsh ; Anumeha ; Sheu, Gene

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Asia Univ., Taichung, Taiwan
  • fYear
    2012
  • fDate
    6-7 March 2012
  • Firstpage
    65
  • Lastpage
    68
  • Abstract
    Energy capability of a LDMOS device structure is shown to have nonlinear relationship with ambient temperature. Analytical model for energy capability has been discussed and is in good agreement with the simulation results. The dependency of critical temperature on ambient temperature is shown.
  • Keywords
    MIS devices; semiconductor device models; LDMOS device structure; ambient temperature; critical temperature; energy capability; nonlinear relationship; Analytical models; Conductivity; Heating; Silicon; Temperature; Temperature dependence; Thermal conductivity; SOA; TCAD simulation; ambient temperature; critical temperature; energy capability; laterally diffused MOS(LDMOS); thermal failure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-1-4673-0191-6
  • Electronic_ISBN
    978-1-4673-0190-9
  • Type

    conf

  • DOI
    10.1109/ULIS.2012.6193358
  • Filename
    6193358