Title :
Nonlinear optical spectroscopy: Absorption and refraction
Author :
Stryland, E. Van ; Hagan, D. ; Webster, S. ; Padilha, L. ; Przhonska, O. ; Marder, S.
Author_Institution :
Coll. of Opt. & Photonics, Univ. of Central Florida, Orlando, FL, USA
Abstract :
We use multiple spectroscopic techniques including White-Light Continuum Z-scan to characterize materials and find most semiconductors and organics show similar effects. For example, the ratio of real to imaginary parts of chi(3) are comparable.
Keywords :
infrared spectroscopy; light absorption; light refraction; nonlinear optical susceptibility; two-photon spectroscopy; visible spectroscopy; near IR spectrum; nonlinear optical spectroscopy; optical absorption; optical refraction; two-photon absorption; ultrafast third-order nonlinear susceptibility; visible spectrum; white-light continuum Z-scan; Biomedical optical imaging; Electromagnetic wave absorption; Nonlinear optics; Optical feedback; Optical refraction; Organic materials; Semiconductor materials; Spectroscopy; Ultrafast electronics; Ultrafast optics; nonlinear optics; organics; two-photon absorption;
Conference_Titel :
Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics, 2009. CLEO/PACIFIC RIM '09. Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3829-7
Electronic_ISBN :
978-1-4244-3830-3
DOI :
10.1109/CLEOPR.2009.5292510
