• DocumentCode
    1978707
  • Title

    Introducing an industry oriented graduate course: Testing of digital systems

  • Author

    Radu, Mihaela

  • Author_Institution
    Electr. & Comput. Eng. Dept., Rose Hulman Inst. of Technol., Terre Haute, IN, USA
  • fYear
    2011
  • fDate
    5-6 June 2011
  • Firstpage
    98
  • Lastpage
    101
  • Abstract
    According to the International Technology Roadmap for Semiconductors (ITRS), for more than four decades, the semiconductor industry has distinguished itself by the rapid pace of improvements in its products. However, the cost of the increased functionality of components, circuits, and systems, is the requirement of more verification and test of the electronic products. In current projects, verification engineers outnumber designers, with the ratio reaching two or three to one for the most complex designs. Additionally, the present globalization trends and needs are driving the universities worldwide, to find new avenues in the programs that they are offering, to be attractive to their prospective students. Addressing the above mentioned matters, an industry oriented graduate course “Testing of Digital Systems” was created and offered for the first time in the academic year 2009-2010 at Rose Hulman Institute of Technology, Terre Haute, Indiana. The paper presents the rationale, integration of the new course in the ECE curricula, description of the course and laboratory activities developed around an industrial grade Automatic Test Equipment, preliminary assessment plans and conclusions.
  • Keywords
    educational courses; educational institutions; electronic engineering education; electronic products; semiconductor industry; ECE curricula; ITRS; International Technology Roadmap for Semiconductors; digital system testing; electronic product testing; industrial grade automatic test equipment; industry oriented graduate course; semiconductor industry; Digital systems; Engineering profession; Fault tolerant systems; Industries; Laboratories; Software; Automatic Test Equipment; digital testing; graduate course; hands-on experience; industrial experience;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Systems Education (MSE), 2011 IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4577-0548-9
  • Electronic_ISBN
    978-1-4577-0550-2
  • Type

    conf

  • DOI
    10.1109/MSE.2011.5937103
  • Filename
    5937103