DocumentCode
1978707
Title
Introducing an industry oriented graduate course: Testing of digital systems
Author
Radu, Mihaela
Author_Institution
Electr. & Comput. Eng. Dept., Rose Hulman Inst. of Technol., Terre Haute, IN, USA
fYear
2011
fDate
5-6 June 2011
Firstpage
98
Lastpage
101
Abstract
According to the International Technology Roadmap for Semiconductors (ITRS), for more than four decades, the semiconductor industry has distinguished itself by the rapid pace of improvements in its products. However, the cost of the increased functionality of components, circuits, and systems, is the requirement of more verification and test of the electronic products. In current projects, verification engineers outnumber designers, with the ratio reaching two or three to one for the most complex designs. Additionally, the present globalization trends and needs are driving the universities worldwide, to find new avenues in the programs that they are offering, to be attractive to their prospective students. Addressing the above mentioned matters, an industry oriented graduate course “Testing of Digital Systems” was created and offered for the first time in the academic year 2009-2010 at Rose Hulman Institute of Technology, Terre Haute, Indiana. The paper presents the rationale, integration of the new course in the ECE curricula, description of the course and laboratory activities developed around an industrial grade Automatic Test Equipment, preliminary assessment plans and conclusions.
Keywords
educational courses; educational institutions; electronic engineering education; electronic products; semiconductor industry; ECE curricula; ITRS; International Technology Roadmap for Semiconductors; digital system testing; electronic product testing; industrial grade automatic test equipment; industry oriented graduate course; semiconductor industry; Digital systems; Engineering profession; Fault tolerant systems; Industries; Laboratories; Software; Automatic Test Equipment; digital testing; graduate course; hands-on experience; industrial experience;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Systems Education (MSE), 2011 IEEE International Conference on
Conference_Location
San Diego, CA
Print_ISBN
978-1-4577-0548-9
Electronic_ISBN
978-1-4577-0550-2
Type
conf
DOI
10.1109/MSE.2011.5937103
Filename
5937103
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