Title :
An incremental ADC sensor interface with input switch-Less integrator featuring 220-nVrms resolution with ±30-mV input range
Author :
Bonizzoni, Edoardo ; Perez, Aldo Peña ; Caracciolo, Hervé ; Stoppa, David ; Maloberti, Franco
Author_Institution :
Dipt. di Ing. Ind. e dell´´Inf., Univ. of Pavia, Pavia, Italy
Abstract :
An incremental ADC for Wheatstone CMOS stress sensor systems is described. A switched-capacitors integrator without switches toward virtual ground avoids spur signals, clock feed-through, residual offset and glitches. The circuit, fabricated in a 0.35-μm CMOS technology, consumes 42 μW at 500-kHz clock and 2.8-V supply. Low speed chopping cancels offset and limits the 1/f noise contribution. The signal-to-noise ratio with measures lasting 220 periods is 114 dB at ±100 mV full-scale range. The active area is 0.32 mm2.
Keywords :
1/f noise; analogue-digital conversion; integrating circuits; low-power electronics; sensors; switched capacitor networks; 1/f noise contribution; Wheatstone CMOS stress sensor system; frequency 500 kHz; incremental ADC sensor interface; input switch-less integrator; power 42 muW; signal-to-noise ratio; size 0.35 mum; switched-capacitors integrator; virtual ground; voltage 2.8 V; Capacitance; Capacitors; Clocks; Signal to noise ratio; Switches; Voltage measurement;
Conference_Titel :
ESSCIRC (ESSCIRC), 2012 Proceedings of the
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4673-2212-6
Electronic_ISBN :
1930-8833
DOI :
10.1109/ESSCIRC.2012.6341276