• DocumentCode
    1978856
  • Title

    Further development with heavy ion sources at Brookhaven National Laboratory´s Tandem van de Graaff Facility

  • Author

    Zarcone, M.J. ; Steski, D.B. ; Smith, K.S. ; Thieberger, P.

  • Author_Institution
    Brookhaven Nat. Lab., Upton, NY, USA
  • fYear
    1993
  • fDate
    17-20 May 1993
  • Firstpage
    3178
  • Abstract
    The Ion Source Test and Development Group at Brookhaven National Laboratory´s Tandem Van de Graaff Facility has been evaluating the Peabody Scientific PSX-120 negative ion caesium sputter source for use as the source of pulsed negative ion beams for injection in the Brookhaven synchrotrons. The decrease in emittance due to the use of a spherical ionizer, as recently reported, may lead to improved brightness of the beam injected into the MP Tandem resulting in improved beam output. Emittance measurements with the PSX-120 are presented for dc beams and some of the first pulsed beam results are also discussed
  • Keywords
    ion sources; particle beam diagnostics; Cs; Cs sputter source; PSX-120 sputter source; Tandem Van de Graaff Facility; dc beams; emittance; heavy ion sources; pulsed negative ion beams; Current measurement; Electron emission; Ion beams; Ion sources; Laboratories; Lenses; Pulse measurements; Structural beams; Testing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 1993., Proceedings of the 1993
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-1203-1
  • Type

    conf

  • DOI
    10.1109/PAC.1993.309592
  • Filename
    309592