Title :
Further development with heavy ion sources at Brookhaven National Laboratory´s Tandem van de Graaff Facility
Author :
Zarcone, M.J. ; Steski, D.B. ; Smith, K.S. ; Thieberger, P.
Author_Institution :
Brookhaven Nat. Lab., Upton, NY, USA
Abstract :
The Ion Source Test and Development Group at Brookhaven National Laboratory´s Tandem Van de Graaff Facility has been evaluating the Peabody Scientific PSX-120 negative ion caesium sputter source for use as the source of pulsed negative ion beams for injection in the Brookhaven synchrotrons. The decrease in emittance due to the use of a spherical ionizer, as recently reported, may lead to improved brightness of the beam injected into the MP Tandem resulting in improved beam output. Emittance measurements with the PSX-120 are presented for dc beams and some of the first pulsed beam results are also discussed
Keywords :
ion sources; particle beam diagnostics; Cs; Cs sputter source; PSX-120 sputter source; Tandem Van de Graaff Facility; dc beams; emittance; heavy ion sources; pulsed negative ion beams; Current measurement; Electron emission; Ion beams; Ion sources; Laboratories; Lenses; Pulse measurements; Structural beams; Testing; Wires;
Conference_Titel :
Particle Accelerator Conference, 1993., Proceedings of the 1993
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-1203-1
DOI :
10.1109/PAC.1993.309592
