Title :
Design and Test of InP DHBT ICs for a 100 Gb/s Demonstrator System
Author :
Swahn, Thomas ; Hallin, Joakim ; Kjellberg, Torgil
Keywords :
Bit rate; Electronic equipment testing; Indium phosphide; Instruments; Integrated circuit testing; Manufacturing; Microwave technology; System testing; Telecommunication traffic; Time division multiplexing;
Conference_Titel :
Indium Phosphide and Related Materials Conference Proceedings, 2006 International Conference on
Print_ISBN :
0-7803-9558-1
DOI :
10.1109/ICIPRM.2006.1634116
