Title :
An intelligent hand-held microsurgical instrument for improved accuracy
Author :
Ang, Wei Tech ; Khosla, Pradeep K. ; Riviere, Cameron N.
Author_Institution :
Robotics Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This paper presents the development and initial experimental results of the first prototype of Micron, an active hand-held instrument to sense and compensate physiological tremor and other unwanted movement during vitreoretinal microsurgery. The instrument incorporates six inertial sensors, allowing the motion of the tip to be computed. The motion captured is processed to discriminate between desired and undesired components of motion. Tremor canceling is implemented via the weighted-frequency Fourier linear combiner (WFLC) algorithm, and compensation of non-tremorous error via a neural-network technique is being investigated. The instrument tip is attached to a three-degree-of-freedom parallel manipulator with piezoelectric actuation. The actuators move the tool tip in opposition to the tremor, thereby suppressing the erroneous motion. Motion canceling experiments with oscillatory motions in the frequency band of physiological tremor show that Micron is able to reduce error amplitude by 45.3% in 1-D tests and 34.3% in 3-D tests.
Keywords :
biomedical equipment; computerised instrumentation; eye; intelligent actuators; manipulators; medical robotics; neural nets; surgery; Micron; active hand-held instrument; desired components; erroneous motion; error amplitude reduction; frequency band; improved accuracy; inertial sensors; instrument tip; intelligent hand-held microsurgical instrument; neural-network technique; oscillatory motions; piezoelectric actuation; tremor canceling; undesired components; vitreoretinal microsurgery; weighted-frequency Fourier linear combiner algorithm; Costs; Frequency; Humans; Instruments; Microsurgery; Prototypes; Robots; Stability; Surgery; Testing;
Conference_Titel :
Engineering in Medicine and Biology Society, 2001. Proceedings of the 23rd Annual International Conference of the IEEE
Print_ISBN :
0-7803-7211-5
DOI :
10.1109/IEMBS.2001.1019572