Title :
An Adaptive Frequency Sampling Method for Frequency Selective Surface design Exploiting Steor-Bulirsch Algorithm
Author :
Chen, J.Q. ; Liu, Z.W. ; Chen, R.S. ; Ding, D.Z. ; Fan, Z.H. ; Ye, X.D. ; Sha, K.
Author_Institution :
Dept. of Commun. Eng., Nanjing Univ. of Sci. & Technol., Nanjing
Abstract :
In this paper, the adaptive frequency sampling (AFS) method with Steor-Bulirsch (SB) algorithm is proposed in conjunction with the method of moments (MOM) to calculate the broadband electromagnetic scattering performance of the frequency selective surface (FSS). Comparing with other sampling methods, the Store-Bulirsch algorithm is a recursive tabular method and requires no matrix inversion, so it can obtain a rational interpolation function without suffering from singularity problems. Furthermore, since we use the AFS strategy to interpolate the final results, no more information is needed except the sampled frequency f and its true value, so it can be widely used in most of the electromagnetic (EM) simulation. Numerical results show that our sampling strategy has a good performance in both CPU time saving and computation accuracy.
Keywords :
electromagnetic wave scattering; frequency selective surfaces; interpolation; method of moments; recursive estimation; Steor-Bulirsch algorithm; adaptive frequency sampling method; broadband electromagnetic scattering; electromagnetic simulation; frequency selective surface design; method of moments; rational interpolation function; recursive tabular method; Algorithm design and analysis; Computational modeling; Electromagnetic scattering; Frequency selective surfaces; Interpolation; Message-oriented middleware; Microwave communication; Microwave theory and techniques; Moment methods; Sampling methods; Adaptive sampling; Electromagnetic scattering; Frequency selective surface (FSS); Method of moments (MOM); Store-Bulirsch algorithm;
Conference_Titel :
Microwave Conference, 2007. APMC 2007. Asia-Pacific
Conference_Location :
Bangkok
Print_ISBN :
978-1-4244-0748-4
Electronic_ISBN :
978-1-4244-0749-1
DOI :
10.1109/APMC.2007.4554968