Title :
Issues in transport
Author_Institution :
Beckman Inst., Illinois Univ., Urbana, IL, USA
Abstract :
In this paper, the four examples that complexity of the connection of quantum effects in nanostructure to the properties of devices and integrated circuits.
Keywords :
MOSFET; ballistic transport; biomedical equipment; nanostructured materials; semiconductor device reliability; surface emitting lasers; MOS transistors; ballistic transport; devices properties; integrated circuits; nanostructure; quantum effect connection; semiconductor device reliability;
Conference_Titel :
Device Research Conference, 2003
Print_ISBN :
0-7803-7727-3
DOI :
10.1109/DRC.2003.1226848
