Title :
Microwave performance of diamond surface-channel FET
Author :
Kasu, Makoto ; Kubovic, M. ; Aleksov, A. ; Kallfass, I. ; Spitzberg, U. ; Kobayashi, N. ; Schumacher, H. ; Kohn, E.
Author_Institution :
Dept. of Electron Devices and Circuits, Ulm Univ., Germany
Abstract :
In this paper, the microwave characteristics of diamond FETs with 0.2/spl mu/m gate length (L/sub G/) are discussed.
Keywords :
diamond; elemental semiconductors; field effect transistors; microwave measurement; noise measurement; 0.2 micron; diamond surface-channel FET; microwave noise measurements; microwave properties; Circuits; Cutoff frequency; Electric breakdown; Electron devices; Laboratories; Microwave FETs; Microwave devices; Noise figure; Noise measurement; Thermal conductivity;
Conference_Titel :
Device Research Conference, 2003
Conference_Location :
Salt Lake City, UT, USA
Print_ISBN :
0-7803-7727-3
DOI :
10.1109/DRC.2003.1226853
