Title :
New BIST scheme and 3-D generic diagnostic algorithm for nano-scale devices
Author :
Elbably, Mohamed
Author_Institution :
Fac. of Eng., Dept. of Electron., Commun. & Comput. Eng., Helwan Univ., Cairo, Egypt
Abstract :
To test and diagnose the nano-scale devices a new test scheme and diagnostic generic algorithm for three directions (3-D) will be presented. Isolate any faulty block(s) and preventing the fault effect propagation among the nano-devices is the major challenges for these new nano-devices. In this research, a new built-in self-test (BIST) scheme will be proposed using different modes with two test configurations to test any selected block(s) in nano devices. Also, based on results of the proposed BIST scheme, a generic 3-D diagnostic algorithm to identify the faulty and fault-free blocks will be presented. An practical analysis to evaluate the average amount of hardware and time required for the proposed algorithm will be presented.
Keywords :
built-in self test; electronic design automation; fault diagnosis; field programmable gate arrays; logic testing; nanoelectromechanical devices; 3D generic diagnostic algorithm; BIST scheme; built-in self-test scheme; fault effect propagation; fault-free block identification; faulty block identification; faulty block isolation; nanoscale devices; Algorithm design and analysis; Built-in self-test; Circuit faults; Fault diagnosis; Field programmable gate arrays; Nanoscale devices; Registers; Electronics design automation (EDA); diagnostic and generic algorithm design for digital systems; testing;
Conference_Titel :
System Engineering and Technology (ICSET), 2013 IEEE 3rd International Conference on
Conference_Location :
Shah Alam
Print_ISBN :
978-1-4799-1028-1
DOI :
10.1109/ICSEngT.2013.6650202
