Title :
Expert system based on wavelets and DELT measurements for VDSL systems
Author :
Sales, C. ; Lima, V. ; Ikeda, G. ; Rodrigues, Roberto M. ; Ericson, K. ; Klautau, Aldebaro ; Costa, Julio
Author_Institution :
Fed. Univ. of Para (UFPA), Belém, Brazil
Abstract :
Dual-ended line testing (DELT) is a common capability in most current modems and can be used for digital subscriber line (DSL) qualification and monitoring purposes. In spite of that, this feature remains largely unexplored in the literature. This paper proposes a new method based on wavelets and DELT measurements for estimating the total length of the line under test and identification of bridged-taps, two important line parameters that affect the maximum bit rate reached by a DSL line. The proposed method was tested with measurements employing real twisted-pair cables and obtained reasonably accurate results for the analyzed cases.
Keywords :
digital subscriber lines; expert systems; telecommunication computing; testing; wavelet transforms; DELT measurements; DSL line; VDSL systems; bridged-taps identification; digital subscriber line qualiΩcation; dual-ended line testing; expert system; monitoring purposes; twisted-pair cables; wavelets; Very high speed digital subscriber line 2 (VDSL2); dual-ended line testing (DELT); loop make-up;
Conference_Titel :
Global Communications Conference (GLOBECOM), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-0920-2
Electronic_ISBN :
1930-529X
DOI :
10.1109/GLOCOM.2012.6503592