• DocumentCode
    1980532
  • Title

    Fourth-harmonic Generation at Crystalline Si(001) Interfaces

  • Author

    Lee, Yi-Shu ; Downer, M.C.

  • Author_Institution
    Dept. of Phys., Texas Univ., Austin, TX, USA
  • fYear
    1998
  • fDate
    8-8 May 1998
  • Firstpage
    214
  • Lastpage
    215
  • Abstract
    Summary form only given. We previously reported optical fourth-harmonic generation (FHG) in reflection from a GaAs(001) surface using 200-fs pulses, well below the damage threshold.´ The data revealed a strong fourfold anisotropic surface-specific polarization that is not present in second-harmonic generation (SHG) and that, surprisingly, was nearly as strong as the dipole-allowed, twofold anisotropic contribution from the noncentrosymmetric bulk. The unusual relative strength of the surface FH contribution suggested that surface-specific FHG could be observed by itself in reflection from a centrosymmetric crystal. In this work, we demonstrate azimuthally anisotropic FHG from a crystalline Si(OO1) interface using 5-pJ, 200-fs pulses at fluences >5X below the damage threshold. Our data indicate that the surface dipole FH contribution dominates over the bulk quadrupole FH contribution much more strongly than for the corresponding SHG contributions, thus making FHG from Si(OO1) one of the most purely surface-specific optical probes ever reported.
  • Keywords
    optical focusing; optical harmonic generation; silicon; spectroscopy; surface phenomena; symmetry; FH spectroscopy; FHG; Si; extremely short escape depth; fundamental pulse energy; optical fourth-harmonic generation; shorter pulse sources; surface contribution; symmetry; Crystallization; Gallium arsenide; Gratings; Luminescence; Optical films; Optical surface waves; Plasmons; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    1-55752-541-2
  • Type

    conf

  • DOI
    10.1109/IQEC.1998.680454
  • Filename
    680454