DocumentCode :
1980554
Title :
Investigations on oxide-free InGaAlAs waveguides grown by narrow stripe selective MOVPE
Author :
Feng, W. ; Pan, J.Q. ; Zhou, F. ; Zhao, L.J. ; Zhu, H.L. ; Wang, W.
Author_Institution :
Inst. of Semicond., Chinese Acad. of Sci., Beijing
fYear :
0
fDate :
0-0 0
Firstpage :
305
Lastpage :
308
Abstract :
Oxide-free InGaAlAs waveguides have been grown on the InP substrates patterned with pairs of SiO2 mask stripes using narrow stripe selective MOVPE. The mask stripe width is varied from 0 to 40 mum, while the window region width between a pair of mask stripes is fixed at 1.5, 2.5 and 3.5 mum, respectively. Smooth surfaces and flat interfaces are obtained in the selectively grown InGaAlAs waveguides. There exhibit strong dependences of the thickness enhancement ratio and the photoluminescence (PL) spectrum on the mask stripe width and the window region width for the InGaAlAs waveguides. A large PL peak wavelength shift of 79 nm and a PL full width of at half maximum (FWHM) of less than 64 meV are obtained simultaneously. Some possible interpretations for our investigations are presented by considering both the migration effect from a masked region (MMR) and the lateral vapor diffusion effect (LVD)
Keywords :
III-V semiconductors; MOCVD; aluminium compounds; diffusion; gallium arsenide; indium compounds; interface structure; masks; optical waveguides; photoluminescence; semiconductor epitaxial layers; semiconductor growth; silicon compounds; spectral line breadth; surface topography; vapour phase epitaxial growth; 0 to 40 mum; 1.5 mum; 2.5 mum; 3.5 mum; FWHM; InGaAlAs; InP substrates; InP-SiO2; SiO2 mask; flat interface; full width of at half maximum; lateral vapor diffusion effect; mask stripe width; masked region; migration effect; narrow stripe selective MOVPE; oxide-free InGaAlAs waveguides; photoluminescence; selectively grown InGaAlAs waveguides; smooth surface; stripe surface pattern; thickness enhancement ratio; wavelength shift; window region width; Epitaxial growth; Epitaxial layers; Etching; Indium phosphide; Optical device fabrication; Optical materials; Optical waveguides; Plasma temperature; Semiconductor waveguides; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials Conference Proceedings, 2006 International Conference on
Conference_Location :
Princeton, NJ
Print_ISBN :
0-7803-9558-1
Type :
conf
DOI :
10.1109/ICIPRM.2006.1634176
Filename :
1634176
Link To Document :
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