Title :
A GaAs MSI Word Generator Operating at 5 Gbit/s Data Rate
Author :
Liechti, C. ; Baldwin, G. ; Gowen, E. ; Hennig, F. ; Namjoo, M. ; Podell, A.
Author_Institution :
Hewlett-Packard Laboratories, 1501 Page Mill Road, Palo Alto, CA 94304, U.S.A.
Abstract :
A high-speed GaAs word generator has been designed with computer aids, built, and tested for applications in commerical test instrumentation. This medium-scale-integrated circuit incorporates 600 active devices. It consists of an 8:1 parallel-to-serial data converter, a timing generator, word-length control logic, and ECL interface networks. The circuit generates multiple 8-bit words whose number can be dynamically controlled. By changing the clock frequency, the output data rate can be varied from 1 kbit/s up to 5 Gbit/s.
Keywords :
Circuit testing; Clocks; Gallium arsenide; Logic circuits; Logic gates; Multiplexing; Schottky diodes; Signal generators; Silicon; Timing;
Conference_Titel :
Microwave Conference, 1981. 11th European
Conference_Location :
Amsterdam, Netherlands
DOI :
10.1109/EUMA.1981.332964