DocumentCode :
1981026
Title :
Iterative abstraction-based CTL model checking
Author :
Jang, Jae-Young ; Moon, In-Ho ; Hachtel, Gary D.
Author_Institution :
Motorola Inc., Austin, TX, USA
fYear :
2000
fDate :
2000
Firstpage :
502
Lastpage :
507
Abstract :
A paradigm for automatic approximation/refinement in conservative CTL model checking is presented. The approximations are used to verify a given formula conservatively by computing upper and lower bounds to the set of satisfying states at each sub-formula. These approximations attempt to perform conservative verification with the least possible number of BDD variables and BDD nodes. We present new forms of operational graphs to avoid limitations associated with previously used operational graphs. Three new techniques for efficient automatic refinement of approximate system are presented. These methods make it easier to find the locality. We also present a new type of don´t cares (approximate satisfying don´t cares) that can make model checking more efficient in time and space. On average, an order of magnitude speedup was achieved
Keywords :
approximation theory; binary decision diagrams; circuit analysis computing; graph theory; iterative methods; BDD nodes; BDD variables; automatic approximation; automatic refinement; iterative abstraction-based CTL model checking; lower bounds; operational graphs; upper bounds; Automata; Binary decision diagrams; Clocks; Formal verification; Moon; State-space methods; System testing; Tree graphs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-0537-6
Type :
conf
DOI :
10.1109/DATE.2000.840831
Filename :
840831
Link To Document :
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