• DocumentCode
    1981208
  • Title

    MBE Growth of TlInGaAs/TlInP/InP SCH LDs and Their Laser Operation

  • Author

    Fujiwara, A. ; Matsumoto, T. ; Krishnamurthy, Dheepak ; Hasegawa, S. ; Asahi, H.

  • Author_Institution
    ISIR, Osaka Univ.
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    426
  • Lastpage
    428
  • Abstract
    TlInGaAs/TllnP/InP separate confinement heterostructures (SCHs) were grown by gas-source molecular-beam epitaxy and metal stripe laser diodes (LDs) were fabricated. Temperature variation of electroluminescence peak wavelength was as small as 0.06 nm/K due to the reduced temperature variation of band gap energy of TlInGaAs. Pulsed laser operation was achieved at 77 K - 297 K. Threshold current density for the TlInGaAs/TlInP/InP SCH LD (0.6 kA/cm2 at 77 K) was smaller than that for the TlInGaAs/InP double heterostructure LD (0.8 kA/cm2 at 77 K), which is due to the increased refractive index for TlInP and the improved optical confinement. Temperature variation of main peak wavelength in the lasing spectra was as small as 0.07 nm/K, which is much smaller than those for the InGaAsP/InP Fabry-Perot LDs (0.4 nm/K) and distributed feed-back LDs (0.1 nm/K)
  • Keywords
    III-V semiconductors; current density; electroluminescence; energy gap; gallium arsenide; indium compounds; molecular beam epitaxial growth; optical pulse generation; refractive index; semiconductor growth; semiconductor lasers; thallium compounds; 77 to 297 K; MBE; TlInGaAs-TlInP-InP; TlInGaAs/TlInP/InP SCH LD; band gap energy; electroluminescence; gas-source molecular-beam epitaxy; metal stripe laser diode; optical confinement; refractive index; separate confinement heterostructure; threshold current density; Diode lasers; Electroluminescence; Gas lasers; Indium phosphide; Molecular beam epitaxial growth; Optical pulses; Photonic band gap; Refractive index; Temperature; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials Conference Proceedings, 2006 International Conference on
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    0-7803-9558-1
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2006.1634207
  • Filename
    1634207