Title :
Extinction ratio compensation by free carrier injection for a MOS-capacitor microring optical modulator subjected to temperature drifting
Author :
Shih, Chih T sung ; Zeng, Zhi Wei ; Chao, Shiuh
Author_Institution :
Inst. of Photonics Technol., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
We have analyzed the temperature stability of a MOS-capacitor microring optical modulator that was designed for critical coupling. We found that free carrier injection through DC bias control can compensate the extinction ratio (ER) drop that was caused by temperature drifting. 0.22degC temperature drifting would drop the ER to 5 dB without DC bias and 8.7 V DC bias could extend the 5 dB limit to 1.86degC temperature drifting.
Keywords :
MOS capacitors; infrared spectra; integrated optics; integrated optoelectronics; micro-optics; optical modulation; thermo-optical effects; DC bias control; MOS-capacitor microring optical modulator; critical coupling; dense optoelectronic integration; extinction ratio compensation; free carrier injection; temperature drifting; transmittance spectra; Erbium; Extinction ratio; Optical modulation; Optical refraction; Optical variables control; Optical waveguides; Refractive index; Silicon on insulator technology; Temperature control; Voltage control; MOS capacitors; microring; optical modulator; semiconductor waveguides; silicon on insulator (SOI) technology; silicon photonics;
Conference_Titel :
Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics, 2009. CLEO/PACIFIC RIM '09. Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3829-7
Electronic_ISBN :
978-1-4244-3830-3
DOI :
10.1109/CLEOPR.2009.5292625
