DocumentCode :
1981327
Title :
Cost reduction and evaluation of a temporary faults detecting technique
Author :
Anghel, Lorena ; Nicolaidis, Michael
Author_Institution :
TIMA, France
fYear :
2000
fDate :
2000
Firstpage :
591
Lastpage :
598
Abstract :
IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly sensitive to noise, which will result in unacceptable rates of soft-errors. Furthermore, defect behavior is becoming increasingly complex resulting in increasing number of timing faults that can escape detection by fabrication testing. Thus, fault tolerant techniques will become necessary even for commodity applications. This work considers the implementation and improvements of a new soft error and timing error detecting technique based on time redundancy. Arithmetic circuits were used as test vehicle to validate the approach. Simulations and performance evaluations of the proposed detection technique were made using time and logic simulators. The obtained results show that detection of such temporal faults can be achieved by means of meaningful hardware and performance cost
Keywords :
digital integrated circuits; error detection; fault simulation; fault tolerance; integrated circuit reliability; integrated circuit testing; logic simulation; logic testing; redundancy; timing; transient response; arithmetic circuits; concurrent checking; cost reduction; fault modelling; performance cost; performance evaluations; soft error detecting technique; temporal faults; temporary faults detecting technique; time redundancy; timing error detecting technique; transient fault injection simulations; Circuit faults; Circuit simulation; Circuit testing; Costs; Electrical fault detection; Fault detection; Integrated circuit noise; Power supplies; Silicon; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-0537-6
Type :
conf
DOI :
10.1109/DATE.2000.840845
Filename :
840845
Link To Document :
بازگشت