Title :
Performance of a PLC system in impulsive noise with selection combining
Author :
Dubey, Anamika ; Mallik, Ranjan K. ; Schober, Robert
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. - Delhi, Delhi, India
Abstract :
This paper proposes a selection combining (SC) scheme for a power line communication (PLC) system with binary phase-shift keying. The main purpose is to utilize multiple of independent and non-interfering channels to send an information-bearing signal and to use SC at the receiver end to improve the reliability of the PLC system. The fading coefficient of each PLC channel is modeled by a log-normal distribution, and to include the effects of both background noise and impulsive noise, the additive noise samples are taken from a Bernoulli-Gaussian process. We obtain a closed-form approximation of the bit error rate and an expression for the outage probability of the proposed scheme. The merit of the L-channel PLC system with SC when compared with a single channel PLC system over different fading and impulsive noise scenarios is demonstrated through numerical results.
Keywords :
carrier transmission on power lines; error statistics; fading channels; impulse noise; log normal distribution; phase shift keying; probability; telecommunication network reliability; Bernoulli-Gaussian process; L-channel PLC system; PLC channel; PLC system reliability; SC scheme; additive noise samples; background noise; binary phase-shift keying; bit error rate; closed-form approximation; fading coefficient; fading noise scenarios; impulsive noise scenarios; independent channel; information-bearing signal; log-normal distribution; non-interfering channels; outage probability; power line communication system; receiver end; selection combining scheme; single channel PLC system; Bernoulli-Gaussian process; Lambert L-function; binary phase-shift keying (BPSK); bit error rate (BER); log-normal fading; power line communication (PLC); selection combining (SC);
Conference_Titel :
Global Communications Conference (GLOBECOM), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-0920-2
Electronic_ISBN :
1930-529X
DOI :
10.1109/GLOCOM.2012.6503658