Title :
A versatile built-in self test scheme for delay fault testing
Author :
Tsiatouhas, Y. ; Haniotakis, Th ; Nikolos, D. ; Arapoyanni, A.
Author_Institution :
ISD SA, Greece
Abstract :
Summary form only given. A new Built-in Self Test (BIST) scheme is presented that can be used for both off-line production or periodic testing of delay faults as well as for concurrent detection of faults causing signal delays in the field. The scheme is based on the IDDT monitoring of the outputs of the circuit under test (CUT). The proposed scheme has minimal impact on the performance and silicon area of the design since the same response verifier circuit is used for both off-line and concurrent detection of errors in the field
Keywords :
built-in self test; delays; integrated circuit testing; logic testing; production testing; BIST scheme; IDDT monitoring; concurrent detection; delay fault testing; offline production testing; periodic testing; response verifier circuit; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay; Electrical fault detection; Fault detection; Monitoring; Production; Silicon;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-0537-6
DOI :
10.1109/DATE.2000.840889
