• DocumentCode
    1982266
  • Title

    A versatile built-in self test scheme for delay fault testing

  • Author

    Tsiatouhas, Y. ; Haniotakis, Th ; Nikolos, D. ; Arapoyanni, A.

  • Author_Institution
    ISD SA, Greece
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    756
  • Abstract
    Summary form only given. A new Built-in Self Test (BIST) scheme is presented that can be used for both off-line production or periodic testing of delay faults as well as for concurrent detection of faults causing signal delays in the field. The scheme is based on the IDDT monitoring of the outputs of the circuit under test (CUT). The proposed scheme has minimal impact on the performance and silicon area of the design since the same response verifier circuit is used for both off-line and concurrent detection of errors in the field
  • Keywords
    built-in self test; delays; integrated circuit testing; logic testing; production testing; BIST scheme; IDDT monitoring; concurrent detection; delay fault testing; offline production testing; periodic testing; response verifier circuit; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay; Electrical fault detection; Fault detection; Monitoring; Production; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-7695-0537-6
  • Type

    conf

  • DOI
    10.1109/DATE.2000.840889
  • Filename
    840889
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1982266