Title : 
A New SAR Despeckling Method Based on Contourlet Transform
         
        
            Author : 
Chen, Guozhong ; Liu, Xingzhao
         
        
            Author_Institution : 
Dept. Electron. Eng. of Shanghai Jiao Tong, Univ. Shanghai Jiao Tong Univ., Shanghai
         
        
        
        
        
        
            Abstract : 
Synthetic Aperture Radar (SAR) image despeckling is an important problem in the SAR applications. The demand for the speckle reduction of SAR images is to smooth the speckle noise while preserving the structure information of the original images. Because contourlet is a new and more effective signal representation tool than wavelet in many image applications, we propose an improved despeckling method based on the hidden Markov tree (HMT) model in contourlet domain. In the new method, a parameter named inter-direction variation coefficient which takes advantages of both inter-direction dependency of the contourlet coefficients and measurement of the scene heterogeneity is developed to upgrade the performance. Experiments on the real SAR images show that the proposed method achieves better performance in contrary to other despeckling methods.
         
        
            Keywords : 
hidden Markov models; image denoising; radar imaging; signal representation; synthetic aperture radar; SAR image despeckling; contourlet coefficient; contourlet domain; contourlet transform; hidden Markov tree model; inter-direction dependency; inter-direction variation coefficient; scene heterogeneity; signal representation; speckle noise reduction; synthetic aperture radar; Filter bank; Hidden Markov models; Layout; Microwave theory and techniques; Noise reduction; Radar applications; Radar imaging; Speckle; Synthetic aperture radar; Wavelet transforms; Synthetic Aperture Radar (SAR); contourlet; speckle;
         
        
        
        
            Conference_Titel : 
Microwave Conference, 2007. APMC 2007. Asia-Pacific
         
        
            Conference_Location : 
Bangkok
         
        
            Print_ISBN : 
978-1-4244-0748-4
         
        
            Electronic_ISBN : 
978-1-4244-0749-1
         
        
        
            DOI : 
10.1109/APMC.2007.4555103