Title :
Characterisation of Localised Strain at Purged lnP → GalnAs & GalnAs → lnP Interfaces
Author :
Yates, M.J. ; Aylett, M.R. ; Perrin, S.D. ; Hockly, M.
Author_Institution :
BT Laboratories, UK
Keywords :
Capacitive sensors; Epitaxial growth; Epitaxial layers; Indium phosphide; Probes;
Conference_Titel :
Metalorganic Vapor Phase Epitaxy, 1992. Sixth International Conference
Print_ISBN :
0-87942-652-7
DOI :
10.1109/MOVPE.1992.665035
