• DocumentCode
    19825
  • Title

    Low Overhead Software Wear Leveling for Hybrid PCM + DRAM Main Memory on Embedded Systems

  • Author

    Jingtong Hu ; Mimi Xie ; Chen Pan ; Xue, Chun Jason ; Qingfeng Zhuge ; Sha, Edwin H.-M

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Oklahoma State Univ., Stillwater, OK, USA
  • Volume
    23
  • Issue
    4
  • fYear
    2015
  • fDate
    Apr-15
  • Firstpage
    654
  • Lastpage
    663
  • Abstract
    Phase change memory (PCM) is a promising DRAM replacement in embedded systems due to its attractive characteristics, such as low-cost, shock-resistivity, nonvolatility, high density, and low leakage power. However, relatively low endurance has limited its practical applications. In this paper, in addition to existing hardware level optimizations, we propose software enabled wear-leveling techniques to further extend PCMs lifetime when it is adopted in embedded systems. Most existing software optimization techniques focus on reducing the total number of writes to PCM, but none of them consider wear leveling, in which the writes are distributed more evenly over the PCM. An integer linear programming formulation and a polynomial-time algorithm, the software wear-leveling algorithm, are proposed in this paper to achieve wear leveling without hardware overhead. According to the experimental results, the proposed techniques can reduce the number of writes on the most-written addresses by more than 80% when compared with a greedy algorithm, and by more than 60% when compared with the existing optimal data allocation algorithm with under 6% memory access overhead.
  • Keywords
    DRAM chips; computational complexity; embedded systems; integer programming; linear programming; phase change memories; PCM lifetime extension; embedded systems; high density; hybrid PCM + DRAM main memory; integer linear programming; low leakage power; low overhead software wear leveling technique; low-cost; nonvolatility; phase change memory; polynomial-time algorithm; shock-resistivity; software optimization techniques; total write number reduction; Embedded systems; Hardware; Nonvolatile memory; Phase change materials; Random access memory; Resource management; DRAM; energy; main memory; nonvolatile memories (NVMs); phase change memory (PCM); wear leveling; write reduction; write reduction.;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2014.2321571
  • Filename
    6820777