Title :
Enhanced smart sensor for integrated system health management
Author :
Nickles, Donald ; Rauth, David ; Schmalzel, John
Keywords :
Calibration; Costs; Feature extraction; Instruments; Intelligent sensors; Read-write memory; Sensor phenomena and characterization; Sensor systems; Temperature sensors; Voltage;
Conference_Titel :
Sensors Applications Symposium, 2006. Proceedings of the 2006 IEEE
Print_ISBN :
0-7803-9580-8
DOI :
10.1109/SAS.2006.1634275
