Title :
Near-field optical second-harmonic microscopy
Author :
Smolyaninov, I.I. ; Lee, C.H. ; Davis, C.C.
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
Abstract :
Summary form only given. We have studied near-field SHG from various samples: rough metal films, LiNbO/sub 3/ waveguide structures, piezoceramics, etc. Image acquisition time has been substantially reduced in comparison with previous work, down to a few tens of minutes. We show images of surface topography and SHG intensity measured simultaneously using the surface of a poled piezoelectric tube as a sample.
Keywords :
optical harmonic generation; optical images; optical microscopy; optical waveguides; piezoceramics; surface topography measurement; LiNbO/sub 3/; LiNbO/sub 3/ waveguide structures; SHG intensity measure; image acquisition time; near-field SHG; near-field optical second-harmonic microscopy; piezoceramics; poled piezoelectric tube; rough metal films; surface topography measurement; Optical films; Optical harmonic generation; Optical microscopy; Optical surface waves; Optical waveguides; Piezoelectric films; Piezoelectric materials; Rough surfaces; Surface roughness; Surface topography;
Conference_Titel :
Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-541-2
DOI :
10.1109/IQEC.1998.680483
