Title :
Temperature-dependent dispersion relations for nonlinear optical materials of the KTP family
Author :
Yutsis, Ilan ; Kirshner, Benny ; Emanueli, Shai ; Arie, Ady
Author_Institution :
Dept. of Electr. Eng.-Phys. Electron., Tel Aviv Univ., Israel
Abstract :
We have measured the temperature dependence of z and y components of the refractive index for the nonlinear optical materials family of KTP: KTiOPO4 (KTP), KTiOAsO4 (KTA), RbTiOPO4 (RTP) and RbTiOAsO4 (RTA). The measurements were done using an interferometric setup in the wavelength range of 532-1580 nm and in the temperature range of 25-200°C. In addition, the thermal expansion coefficients were measured in the x direction. For RTA, the accuracy of the equation of dnz/dT was further improved in the mid-infrared using frequency conversion measurements.
Keywords :
ferroelectric materials; optical dispersion; optical materials; refractive index measurement; thermal expansion measurement; 25 to 200 C; 532 to 1580 nm; KTA; KTP; KTP family; KTiOAsO4; KTiOPO4; KTiOPO4; RTA; RTP; RbTiOAsO4; RbTiOPO4; dispersion relations; ferroelectric materials; frequency conversion measurements; interferometric setup; mid-infrared; nonlinear optical materials; refractive index; temperature dependence; thermal expansion coefficients; Dispersion; Equations; Optical interferometry; Optical materials; Refractive index; Temperature dependence; Temperature distribution; Temperature measurement; Thermal expansion; Wavelength measurement;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 2004. Proceedings. 2004 23rd IEEE Convention of
Print_ISBN :
0-7803-8427-X
DOI :
10.1109/EEEI.2004.1361134
