Internal spatial modes of one-dimensional photonic bandgap devices imaged with near-field scanning optical microscopy

Summary form only given.Photonic bandgap (PBG) devices have been used to improve optoelectronic device performance through modification of spontaneous emission and are currently of much interest due to the control of the photonic state, which incorporated defects can provide. The concept of defect localized photon states has led to the design of structures that guide light on the nanometer scale. Near-field scanning optical microscopy length band-edge transmission spectra of a sample consisting of four air gaps on each side of a central defect with a 400-nm periodicity is displayed. The topographic image, taken simultaneously with the 856-nm data set, is used to correlate the spatial modes to the PEG structure.