Title :
Pattern classification using a support vector machine for genetic disease diagnosis
Author :
David, Amit ; Lerner, Boaz
Author_Institution :
Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
Abstract :
A support vector machine (SVM) classifies real world data of cytogenetic signals measured from fluorescence in-situ hybridization (FISH) images in order to diagnose genetic syndromes. The study implements the SVM structural risk minimization concept in searching for the optimal setting of the classifier kernel and parameters. We propose thresholding the distance of tested patterns from the SVM separating hyperplane as a way of rejecting a percentage of the misclassified patterns, thereby allowing reduction of the expected risk. Results show accurate performance of the SVM in classifying FISH signals in comparison to other state-of-the-art machine learning classifiers, indicating the potential of an SVM-based genetic diagnosis system.
Keywords :
cellular biophysics; genetics; learning (artificial intelligence); medical image processing; minimisation; pattern classification; support vector machines; FISH images; SVM separating hyperplane; SVM structural risk minimization concept; chromosome analysis; cytogenetic signals; fluorescence in-situ hybridization images; genetic disease diagnosis; genetic syndromes; machine learning classifiers; misclassified patterns; pattern classification; support vector machine; Diseases; Fluorescence; Genetics; Kernel; Marine animals; Pattern classification; Risk management; Support vector machine classification; Support vector machines; Testing;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 2004. Proceedings. 2004 23rd IEEE Convention of
Print_ISBN :
0-7803-8427-X
DOI :
10.1109/EEEI.2004.1361148