DocumentCode :
1984253
Title :
Applications of X-ray lasers
Author :
Trebes, James ; Balhorn, R. ; Barbee, T. ; Da Silva, Lucas ; Eder, D. ; Koch, Jurgen ; Lehr, D. ; London, R. ; MacGowan, B. ; Matthews, Darin ; Mrowka, S. ; Procassini, R. ; Ress, D.
Author_Institution :
Lawrence Livermore Nat. Lab., Livermore, CA, USA
fYear :
1993
fDate :
7-9 June 1993
Firstpage :
144
Abstract :
Summary form only given. Contact, transmission, and reflection X-ray laser microscopes have been constructed and are being used for biological microstructure studies. Two-dimensional images are being produced with sub-1000/spl Aring/ resolution. Efforts to improve the resolution and produce three-dimensional images are underway. X-ray lasers are also being used in moire deflectrometry experiments designed to measure electron density gradients in laser plasmas at densities near or above critical. An X-ray laser based interferometer is being designed for measuring two-dimensional electron density profiles in laser plasmas. In materials sciences, X-ray laser based experiments designed to study cluster formation are being developed. All of these applications exploit the unique short pulse, extremely high brightness output of the X-ray laser.
Keywords :
X-ray lasers; 2D images; X-ray laser based interferometer; X-ray laser microscopes; X-ray lasers; biological microstructure; cluster formation; electron density gradients; electron density profiles; high brightness output; laser plasmas; moire deflectrometry experiments; resolution; short pulse; three-dimensional images; Density measurement; Electrons; Image resolution; Laser applications; Laser theory; Optical design; Plasma applications; Plasma measurements; X-ray imaging; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1993. IEEE Conference Record - Abstracts., 1993 IEEE International Conference on
Conference_Location :
Vancouver, BC, Canada
ISSN :
0730-9244
Print_ISBN :
0-7803-1360-7
Type :
conf
DOI :
10.1109/PLASMA.1993.593747
Filename :
593747
Link To Document :
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