• DocumentCode
    1984408
  • Title

    Unsupervised classifying land development in high resolution multi-spectral satellite photos and application for facial features extraction

  • Author

    Lipowezky, Uri ; Furth, Yoram ; Luson, E.

  • Author_Institution
    Dept. of Electron., Jerusalem Coll. of Technol., Israel
  • fYear
    2004
  • fDate
    6-7 Sept. 2004
  • Firstpage
    428
  • Lastpage
    431
  • Abstract
    A novel method of unsupervised detection of the different types of land development using multi-spectral IKONOS satellite photographs is proposed. The method is based on image decomposition into two clusters: the type of land development in quest and the rest of the image, using optimal (the most informative) combination of color and spatial homogeneity indicators. Experimental study of the proposed technique shows fast and reliable deciphering of the vegetation, bare soils, water, roads and residential areas. The results of this preliminary classification are used for accurate decipherment of terrain details using high resolution BW IKONOS photography, which comes along with the multi-spectral one. It is shown that proposed technique is suitable for facial features extraction as well. Fast and reliable detection of human skin, eyes, mouth, hair face triangle and oval is obtained on different subjects.
  • Keywords
    face recognition; feature extraction; image colour analysis; image resolution; terrain mapping; vegetation mapping; IKONOS; bare soils; color homogeneity indicators; eyes; facial features extraction; hair; high resolution BW photography; human skin; image decomposition; land development; mouth; multi-spectral satellite photographs; optimal combination; residential areas; roads; spatial homogeneity indicators; terrain details; unsupervised detection; vegetation; water; Face detection; Facial features; Humans; Image decomposition; Photography; Roads; Satellites; Soil; Spatial resolution; Vegetation mapping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Electronics Engineers in Israel, 2004. Proceedings. 2004 23rd IEEE Convention of
  • Print_ISBN
    0-7803-8427-X
  • Type

    conf

  • DOI
    10.1109/EEEI.2004.1361183
  • Filename
    1361183