DocumentCode :
1984533
Title :
Anomaly detection in three dimensional data based on Gauss Markov random field modeling
Author :
Noiboar, Amir ; Cohen, Israel
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
fYear :
2004
fDate :
6-7 Sept. 2004
Firstpage :
448
Lastpage :
451
Abstract :
We present an anomaly detection approach for three dimensional data. We pre-process the 3D data using the Karhunen-Loeve transform (KLT), to remove correlation between data layers. Each layer is modeled as a Gauss Markov random field (GMRF). We present an efficient least squares method for model estimation. Anomaly detection is carried out in each data layer independently. We assume the anomalies lie in a known signal subspace. A different subspace is assumed for each data layer, such that a-priori knowledge about the sensors used to capture the data, or about the anomalies can be incorporated into the subspace. A parametric form of the model inverse covariance matrix is utilized to yield a computationally efficient detection. We demonstrate the performance of our approach by applying it to the detection of defects in wafer images and to detection of faults in 3D seismic data.
Keywords :
Gaussian processes; Karhunen-Loeve transforms; Markov processes; covariance matrices; crystal defects; least squares approximations; object detection; parameter estimation; seismology; 3D data pre-processing; 3D seismic data; GMRF; Gauss Markov random field; KLT; Karhunen-Loeve transform; anomaly detection; fault detection; inverse covariance matrix; least squares method; model estimation; performance; signal subspace; three dimensional data; wafer image defects; Covariance matrix; Detectors; Fault detection; Gaussian processes; Inverse problems; Karhunen-Loeve transforms; Markov random fields; Parameter estimation; Semiconductor device modeling; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Electronics Engineers in Israel, 2004. Proceedings. 2004 23rd IEEE Convention of
Print_ISBN :
0-7803-8427-X
Type :
conf
DOI :
10.1109/EEEI.2004.1361188
Filename :
1361188
Link To Document :
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