Title :
A study on the portability of CTRON FTAM-CCL and CMISE-CCL interfaces
Author :
Wakano, Masaki ; Sugiyama, Norimasa
Author_Institution :
NTT, Kanagawa, Japan
Abstract :
The CTRON technical committee has planned serveral CTRON portability evaluation tests. The CTRON portability experiment step 2 concentrates on layer 3, layers 4/5, FTAM, and CMISE. The authors give an overview of FTAM and CMISE tests. The portability of FTAM and CMISE interfaces is evaluated by examining problems, time taken, and source code modification required for porting them from their original CTRON basic operating systems to another CTRON basic operating system. The results confirm that the protocol parts of FTAM and CMISE have high portability
Keywords :
network operating systems; open systems; protocols; software portability; standards; CMISE; CTRON basic operating systems; CTRON portability evaluation tests; CTRON portability experiment step 2; CTRON technical committee; FTAM; layer 3; layers 4/5; portability; protocol parts; source code modification; Communication system control; Electrical equipment industry; Information management; Information processing; Information systems; Intelligent networks; Operating systems; Protocols; Software performance; Testing;
Conference_Titel :
TRON Project Symposium, 1992. Proceedings., Ninth
Conference_Location :
Tokyo
Print_ISBN :
0-8186-2990-8
DOI :
10.1109/TRON.1992.313257
