Title :
Embedded e-diagnostic for distributed industrial machinery
Author :
Hui, Tsz Ming James ; Brown, David J. ; Haynes, Barry ; Wang, Xunxian
Author_Institution :
Intelligent Syst. & Diagnostic Res. Group, Portsmouth Univ., UK
Abstract :
Industrial process machine failure often causes severe financial implications. This is compounded by the lack of availability of experts and the complications of getting them to site. One solution is to give the expert access to the machine remotely with the addition of an Artificial Intelligence (AI) based diagnostics software to assist with the decision making process. Our research is based on such a system, which combines modern communications with intelligent diagnostics software. Accessibility to process machines can now be global with the promise of predictability to the diagnosis. It is felt the importance of this research work cannot be overstated with the constantly moving worldwide manufacturing base and the real situation of the machine designers being based in a different country to their customer. The most vulnerable areas of a machine are its parts that consist of electro-mechanical actuation. The author utilises conventional Newtonian physics and differential calculus to model these and an AI technique of fault prediction and detection.
Keywords :
Internet; diagnostic expert systems; distributed decision making; embedded systems; failure analysis; fault diagnosis; production equipment; Newtonian physics; artificial intelligence; decision making process; differential calculus; distributed industrial machinery; electro-mechanical actuation; embedded e-diagnostic; fault detection; fault prediction; financial implications; industrial process machine failure; intelligent diagnostics software; machine designers; worldwide manufacturing; Artificial intelligence; Calculus; Communication system software; Decision making; Fault detection; Machine intelligence; Machinery; Manufacturing; Physics; Predictive models;
Conference_Titel :
Computational Intelligence for Measurement Systems and Applications, 2003. CIMSA '03. 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7783-4
DOI :
10.1109/CIMSA.2003.1227220