Title :
Finitely self-checking circuits and their application on current sensors
Author_Institution :
Reliable Integrated Syst. Group, IMAG/TIM3, Grenoble, France
Abstract :
The theory of digital self-checking circuits has been developed in order to make formal the techniques of designing digital circuits allowing one to ensure on-line concurrent error detection. In recent years analog and mixed signal circuits have gained importance and represent a relevant part of the products of the integrated circuits industry. The design of self-checking analog and mixed signals circuits is a potential solution in order to achieve the reliability of systems using such circuits. Thus, establishing the self-checking theory for analog and mixed signal circuits will allow one to make the design of such circuits formal, and is of great importance. This paper proposes the basic theory of self-checking analog and mixed signal circuits and applies this theory to the case of current checkers which should become in the future an important element for high quality manufacturing, testing and on-line concurrent error detection.<>
Keywords :
analogue circuits; error detection; mixed analogue-digital integrated circuits; production testing; analogue circuits; concurrent error detection; current checkers; current sensors; digital self-checking circuits; mixed signals circuits; self-checking theory; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Digital circuits; Electronics industry; Integrated circuit reliability; Pulp manufacturing; Signal design; Time measurement;
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
DOI :
10.1109/VTEST.1993.313306