Title :
An IEEE 1149.1 based voltmeter/oscilloscope in a chip
Author_Institution :
Texas Instrum., Plano, TX, USA
Abstract :
The concepts of a proposed IEEE 1149.1 based analog test device have been developed. This device can operate on the 1149.1 serial test bus to monitor and store analog signal data in much the same way as traditional analog test instruments. The primary advantage of this device is that it can be included on miniaturized printed circuit boards and within multi-chip modules to provide an embedded method of accessing and testing analog circuitry. This paper describes the proposed device and illustrates how it can be used in a system to monitor both static and dynamic analog signal types.<>
Keywords :
analogue processing circuits; multichip modules; oscilloscopes; voltmeters; IEEE 1149.1; analog signal types; analog test device; embedded method; miniaturized printed circuit boards; multi-chip modules; serial test bus; voltmeter/oscilloscope; Analog circuits; Calibration; Circuit testing; Instruments; Monitoring; Oscilloscopes; Probes; Senior members; Voltage; Voltmeters;
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
DOI :
10.1109/VTEST.1993.313310
