Simulation and generation of I/sub DDQ/ tests for bridging faults in combinational circuits

In the absence of information about the layout and for better defect coverage test generation and fault simulation systems must target all bridging faults. The authors show that an I/sub DDQ/ Test Set that detects all two line bridging faults also detects all multiple line, single cluster bridging faults. A novel algorithm for simulating I/sub DDQ/ tests for all two-line bridging faults in combinational circuits is presented. Experimental results on using randomly generated I/sub DDQ/ test sets for detecting bridging faults are presented. These results point to the computational feasibility of targeting all two line bridging faults in combinational circuits, for the purpose of I/sub DDQ/ test generation.<>