DocumentCode :
1985430
Title :
Minimal hardware multiple signature analysis for BIST
Author :
Yuejian Wu ; Ivanov, A.
Author_Institution :
Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
fYear :
1993
fDate :
6-8 April 1993
Firstpage :
17
Lastpage :
20
Abstract :
Proposes a new BIST multiple intermediate signature analysis scheme which checks n signatures against a single reference. Therefore, the circuitry for checking n signatures is essentially the same as that for checking one signature. The scheme is based on a manipulation of the CUT´s fault-free output sequence. No circuit modification is required. The cost for implementing the scheme is a small nonrecurring CPU time expenditure in the design phase. In return, the scheme yields significant recurring silicon area savings, and reduced aliasing.<>
Keywords :
built-in self test; integrated logic circuits; logic testing; BIST multiple intermediate signature analysis; aliasing; fault-free output sequence; nonrecurring CPU time expenditure; recurring silicon area savings; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Costs; Fault diagnosis; Hardware; Random number generation; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
Type :
conf
DOI :
10.1109/VTEST.1993.313314
Filename :
313314
Link To Document :
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