DocumentCode
1985448
Title
Advanced Simulation and Emulation Techniques for Fault Injection
Author
Valderas, Mario García ; García, Marta Portela ; Cardenal, Raúl Fernández ; Ongil, Celia López ; Entrena, Luis
Author_Institution
Univ. Carlos III de Madrid, Madrid
fYear
2007
fDate
4-7 June 2007
Firstpage
3339
Lastpage
3344
Abstract
The environment can produce transient faults in digital circuits, especially nowadays with the new technology development. Fault injection has been widely used to evaluate the hardness degree of circuits in which fault tolerance is a requirement, like aerospace or automotive applications. The magnitude of the fault effects evaluation problem is computationally unaffordable, if an exhaustive test must be performed on a circuit. Several solutions have been proposed to improve the performance of the process. Simulation based fault injection offers slower execution speed, but a great flexibility in the fault injection campaign. Emulation based solution are much faster, but not so flexible. In this paper, the fault injection problem is analysed from a performance point of view, and some optimized solutions are proposed.
Keywords
circuit optimisation; digital integrated circuits; integrated circuit testing; advanced circuit simulation; digital circuits; emulation techniques; fault injection; transient faults; Aerospace testing; Automotive applications; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Digital circuits; Emulation; Fault tolerance; Performance evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2007. ISIE 2007. IEEE International Symposium on
Conference_Location
Vigo
Print_ISBN
978-1-4244-0754-5
Electronic_ISBN
978-1-4244-0755-2
Type
conf
DOI
10.1109/ISIE.2007.4375151
Filename
4375151
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