Title :
Digest of Papers. Eleventh Annual 1993 IEEE VLSI Test Symposium (Cat. No.93TH0537-1)
Abstract :
Presents the cover from the proceedings of this conference.
Keywords :
VLSI; automatic testing; built-in self test; failure analysis; integrated circuit testing; logic testing; ATPG; BIST; aliasing; compaction; debugging; electric current testing; error detection; failure analysis; mixed signal testing; pseudorandom testing; regular structures; simulation; test methodologies; testability;
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
DOI :
10.1109/VTEST.1993.313317
