Title :
Automatic synthesis of DUT board circuits for testing of mixed signal ICs
Author :
Kao, William H. ; Xia, Jean Q.
Author_Institution :
Cadence Design Syst., San Jose, CA, USA
Abstract :
Test development is without doubt the major bottleneck in the product delivery cycle of mixed signal ICs. One of the most time consuming tasks during the test development phase is the design of the DUT board where the IC is to be inserted to run on a mixed signal tester. This paper describes a new methodology of capturing test information for an IC through test module schematics and then using an automatic tool to synthesize the final load board circuitry to be used on mixed signal ATEs.<>
Keywords :
automatic test equipment; integrated circuit testing; mixed analogue-digital integrated circuits; ATEs; DUT board circuits; final load board circuitry; mixed signal ICs; mixed signal tester; product delivery cycle; test information; Automatic testing; Circuit synthesis; Circuit testing; Integrated circuit testing; Libraries; Relays; Rivers; Signal design; Signal synthesis; System testing;
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
DOI :
10.1109/VTEST.1993.313319
