Title :
A phase-noise model for nonlinear piezoelectrically-actuated MEMS oscillators
Author :
Pardo, Mauricio ; Sorenson, Logan ; Ayazi, Farrokh
Abstract :
This paper presents a new empirical exponential-series-based model that describes the measured phase-noise (PN) of a nonlinear piezoelectric MEMS oscillator. Since the order of terms in the Leeson´s model can only provide at maximum -30 dB/dec slope, a model with higher order terms is proposed to determine an effective resonator quality factor (Qeff) and reflect the reduced contribution of the amplifier flicker-noise. The average fitting error of the proposed model to a 23 MHz in-plane shear (IPS) mode oscillator is found to be less than 1%. Nonlinear operation produces an oscillator with a PN of -130 dBc/Hz at 1kHz offset-frequency, which corresponds to an improvement of about 15 dB compared to linear operation.
Keywords :
Q-factor; micromechanical devices; phase noise; piezoelectric oscillations; Leeson model; amplifier flicker-noise; effective resonator quality factor; empirical exponential-series-based model; frequency 1 kHz; frequency 23 MHz; in-plane shear mode oscillator; nonlinear piezoelectrically-actuated MEMS oscillators; phase-noise model; Fitting; Gain; Micromechanical devices; Oscillators; Piezoelectric devices; Q factor; Resonant frequency;
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
DOI :
10.1109/ISCAS.2011.5937541