DocumentCode
1985549
Title
Hard faults diagnosis in analog circuits using sensitivity analysis
Author
Yunsheng Lu ; Dandapani, R.
Author_Institution
Dept. of Electr. & Comput. Eng., Colorado Univ., Colorado Springs, CO, USA
fYear
1993
fDate
6-8 April 1993
Firstpage
225
Lastpage
229
Abstract
Sensitivity analysis is used to diagnose hard faults in analog circuits. Necessary and sufficient conditions are given to determine the suitability of a given parameter for diagnosis. It is also shown that if a parameter is not suitable then a functional variation of the parameter may be used for diagnosis.<>
Keywords
analogue circuits; fault location; network analysis; network parameters; sensitivity analysis; analog circuits; functional variation; hard faults; sensitivity analysis; Analog circuits; Circuit faults; Circuit testing; Cutoff frequency; Electrical fault detection; Fault diagnosis; Fault location; Sensitivity analysis; Springs; Sufficient conditions;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-8186-3830-3
Type
conf
DOI
10.1109/VTEST.1993.313320
Filename
313320
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