Title :
Hard faults diagnosis in analog circuits using sensitivity analysis
Author :
Yunsheng Lu ; Dandapani, R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Colorado Springs, CO, USA
Abstract :
Sensitivity analysis is used to diagnose hard faults in analog circuits. Necessary and sufficient conditions are given to determine the suitability of a given parameter for diagnosis. It is also shown that if a parameter is not suitable then a functional variation of the parameter may be used for diagnosis.<>
Keywords :
analogue circuits; fault location; network analysis; network parameters; sensitivity analysis; analog circuits; functional variation; hard faults; sensitivity analysis; Analog circuits; Circuit faults; Circuit testing; Cutoff frequency; Electrical fault detection; Fault diagnosis; Fault location; Sensitivity analysis; Springs; Sufficient conditions;
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
DOI :
10.1109/VTEST.1993.313320
